Jandel Universal Probe by Jandel Engineering Limited

Jandel Universal Probe

Highly repeatable needle contact conditions.

Individually adjustable needle loadings with direct indication of set load.

Micrometer controlled slice displacement.

4-point measurement of wafer resistivity and 3-point spreading resistance measurements.

Hinged steel cover to eliminate effects of light and electrical interference.

A high resolution image of the Universal Probe can be seen here

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