Four Point Probes - Test Equipment by Jandel Engineering Limited

	Multiposition Wafer Probe 8" and 6" versions available.

	Multiheight Probe Height adjustable to cope with samples.

	Hand Applied Probe Insulating PTFE body.

	Universal Probe Highly repeatable needle contact conditions.

	Microposition Probe X-Y Micro-manipulation of small samples.

	RM3 Test Meter Microprocessor controlled.

	HM20 Test Meter Portable, battery or mains power operation

Jandel Test Equipment

Jandel manufactures a broad range of manual test equipment.

Constant current source and digital voltmeter available combined in one case.

Please use the Test Equipment menu on the left for more information, or contact us here at Jandel for advice.